/*
* mtest - Perform a memory test
*
* (C) Copyright 2000
* Wolfgang Denk, DENX Software Engineering, wd@denx.de.
*
* See file CREDITS for list of people who contributed to this
* project.
*
* This program is free software; you can redistribute it and/or
* modify it under the terms of the GNU General Public License as
* published by the Free Software Foundation; either version 2 of
* the License, or (at your option) any later version.
*
* This program is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*
* You should have received a copy of the GNU General Public License
* along with this program; if not, write to the Free Software
* Foundation, Inc., 59 Temple Place, Suite 330, Boston,
* MA 02111-1307 USA
*/
#include <common.h>
#include <command.h>
#include <types.h>
/*
* Perform a memory test. A more complete alternative test can be
* configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
* loops until interrupted by ctrl-c or by a failure of one of the
* sub-tests.
*/
#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
static int mem_test(ulong _start, ulong _end, ulong pattern_unused)
{
vu_long *start = (vu_long *)_start;
vu_long *end = (vu_long *)_end;
vu_long *addr;
ulong val;
ulong readback;
vu_long addr_mask;
vu_long offset;
vu_long test_offset;
vu_long pattern;
vu_long temp;
vu_long anti_pattern;
vu_long num_words;
#ifdef CFG_MEMTEST_SCRATCH
vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH;
#else
vu_long *dummy = start;
#endif
int j;
int iterations = 1;
static const ulong bitpattern[] = {
0x00000001, /* single bit */
0x00000003, /* two adjacent bits */
0x00000007, /* three adjacent bits */
0x0000000F, /* four adjacent bits */
0x00000005, /* two non-adjacent bits */
0x00000015, /* three non-adjacent bits */
0x00000055, /* four non-adjacent bits */
0xaaaaaaaa, /* alternating 1/0 */
};
/* XXX: enforce alignment of start and end? */
for (;;) {
if (ctrlc()) {
putchar ('\n');
return 1;
}
printf("Iteration: %6d\r", iterations);
iterations++;
/*
* Data line test: write a pattern to the first
* location, write the 1's complement to a 'parking'
* address (changes the state of the data bus so a
* floating bus doen't give a false OK), and then
* read the value back. Note that we read it back
* into a variable because the next time we read it,
* it might be right (been there, tough to explain to
* the quality guys why it prints a failure when the
* "is" and "should be" are obviously the same in the
* error message).
*
* Rather than exhaustively testing, we test some
* patterns by shifting '1' bits through a field of
* '0's and '0' bits through a field of '1's (i.e.
* pattern and ~pattern).
*/
addr = start;
/* XXX */
if (addr == dummy) ++addr;
for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) {
val = bitpattern[j];
for(; val != 0; val <<= 1) {
*addr = val;
*dummy = ~val; /* clear the test data off of the bus */
readback = *addr;
if(readback != val) {
printf ("FAILURE (data line): "
"expected 0x%08lx, actual 0x%08lx at address 0x%p\n",
val, readback, addr);
}
*addr = ~val;
*dummy = val;
readback = *addr;
if(readback != ~val) {
printf ("FAILURE (data line): "
"Is 0x%08lx, should be 0x%08lx at address 0x%p\n",
readback, ~val, addr);
}
}
}
/*
* Based on code whose Original Author and Copyright
* information follows: Copyright (c) 1998 by Michael
* Barr. This software is placed into the public
* domain and may be used for any purpose. However,
* this notice must not be changed or removed and no
* warranty is either expressed or implied by its
* publication or distribution.
*/
/*
* Address line test
*
* Description: Test the address bus wiring in a
* memory region by performing a walking
* 1's test on the relevant bits of the
* address and checking for aliasing.
* This test will find single-bit
* address failures such as stuck -high,
* stuck-low, and shorted pins. The base
* address and size of the region are
* selected by the caller.
*
* Notes: For best results, the selected base
* address should have enough LSB 0's to
* guarantee single address bit changes.
* For example, to test a 64-Kbyte
* region, select a base address on a
* 64-Kbyte boundary. Also, select the
* region size as a power-of-two if at
* all possible.
*
* Returns: 0 if the test succeeds, 1 if the test fails.
*
* ## NOTE ## Be sure to specify start and end
* addresses such that addr_mask has
* lots of bits set. For example an
* address range of 01000000 02000000 is
* bad while a range of 01000000
* 01ffffff is perfect.
*/
addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long);
pattern = (vu_long) 0xaaaaaaaa;
anti_pattern = (vu_long) 0x55555555;
debug("%s:%d: addr mask = 0x%.8lx\n",
__FUNCTION__, __LINE__,
addr_mask);
/*
* Write the default pattern at each of the
* power-of-two offsets.
*/
for (offset = 1; (offset & addr_mask) != 0; offset <<= 1)
start[offset] = pattern;
/*
* Check for address bits stuck high.
*/
test_offset = 0;
start[test_offset] = anti_pattern;
for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
temp = start[offset];
if (temp != pattern) {
printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx\n",
(ulong)&start[offset], pattern, temp);
return 1;
}
}
start[test_offset] = pattern;
/*
* Check for addr bits stuck low or shorted.
*/
for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) {
start[test_offset] = anti_pattern;
for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
temp = start[offset];
if ((temp != pattern) && (offset != test_offset)) {
printf ("\nFAILURE: Address bit stuck low or shorted @"
" 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
(ulong)&start[offset], pattern, temp);
return 1;
}
}
start[test_offset] = pattern;
}
/*
* Description: Test the integrity of a physical
* memory device by performing an
* increment/decrement test over the
* entire region. In the process every
* storage bit in the device is tested
* as a zero and a one. The base address
* and the size of the region are
* selected by the caller.
*
* Returns: 0 if the test succeeds, 1 if the test fails.
*/
num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
/*
* Fill memory with a known pattern.
*/
for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
start[offset] = pattern;
}
/*
* Check each location and invert it for the second pass.
*/
for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
temp = start[offset];
if (temp != pattern) {
printf ("\nFAILURE (read/write) @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx)\n",
(ulong)&start[offset], pattern, temp);
return 1;
}
anti_pattern = ~pattern;
start[offset] = anti_pattern;
}
/*
* Check each location for the inverted pattern and zero it.
*/
for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
anti_pattern = ~pattern;
temp = start[offset];
if (temp != anti_pattern) {
printf ("\nFAILURE (read/write): @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx)\n",
(ulong)&start[offset], anti_pattern, temp);
return 1;
}
start[offset] = 0;
}
}
}
#else
static int mem_test(ulong _start, ulong _end, ulong pattern)
{
vu_long *addr;
vu_long *start = (vu_long *)_start;
vu_long *end = (vu_long *)_end;
ulong val;
ulong readback;
ulong incr;
int rcode;
incr = 1;
for (;;) {
if (ctrlc()) {
putchar('\n');
return 1;
}
printf ("\rPattern 0x%08lX Writing..."
"%12s"
"\b\b\b\b\b\b\b\b\b\b",
pattern, "");
for (addr=start,val=pattern; addr<end; addr++) {
*addr = val;
val += incr;
}
puts ("Reading...");
for (addr=start,val=pattern; addr<end; addr++) {
readback = *addr;
if (readback != val) {
printf ("\nMem error @ 0x%08X: "
"found 0x%08lX, expected 0x%08lX\n",
(uint)addr, readback, val);
rcode = 1;
}
val += incr;
}
/*
* Flip the pattern each time to make lots of zeros and
* then, the next time, lots of ones. We decrement
* the "negative" patterns and increment the "positive"
* patterns to preserve this feature.
*/
if(pattern & 0x80000000) {
pattern = -pattern; /* complement & increment */
}
else {
pattern = ~pattern;
}
incr = -incr;
}
return rcode;
}
#endif
static int do_mem_mtest (cmd_tbl_t *cmdtp, int argc, char *argv[])
{
ulong start, end, pattern = 0;
if (argc < 3)
return COMMAND_ERROR_USAGE;
start = simple_strtoul(argv[1], NULL, 0);
end = simple_strtoul(argv[2], NULL, 0);
if (argc > 3)
pattern = simple_strtoul(argv[3], NULL, 0);
printf ("Testing 0x%08x ... 0x%08x:\n", (uint)start, (uint)end);
return mem_test(start, end, pattern);
}
static const __maybe_unused char cmd_mtest_help[] =
"Usage: <start> <end> "
#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
"[pattern]"
#endif
"\nsimple RAM read/write test\n";
BAREBOX_CMD_START(mtest)
.cmd = do_mem_mtest,
.usage = "simple RAM test",
BAREBOX_CMD_HELP(cmd_mtest_help)
BAREBOX_CMD_END
